IMS Manthan (The Journal of Mgt., Comp. Science & Journalism)

1. S.a. Gangawane – Holography And Materials Res.lab, Dept. Of Physics, Shivaji Univ., Kolhapur, Maharashtra, India.

2. V.p. Malekar – Holography And Materials Res.lab, Dept. Of Physics, Shivaji Univ., Kolhapur, Maharashtra, India.

3. V.j. Fulari – Holography And Materials Res.lab, Dept. Of Physics, Shivaji Univ., Kolhapur, Maharashtra, India.

Received
21-Jun-2014
Accepted
-
Published
21-Jun-2014
Abstract
In this paper, the effects of electron beam irradiation on the CdTe thin films are studied. The CdTe thin films are characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and contact angle measurements for different bath concentration. The thin film layers are subjected to irradiation of 6 MeV electrons. Finally the effect of irradiation is correlated to crystal size, grain size and contact angle measurements of the CdTe thin films.
Locked
Subscribed
Open Access